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  • Member of Advisory Board, INFORMS Section on Quality, Statistics, and Reliability, July 2022 — present.
  • Department Editor, IISE Transactions (former IIE Transactions) on Design and Manufacturing, 09/01/2017 — 08/31/2020
  • Associate Editor, ASME Transaction, Journal of Manufacturing Science and Engineering, 08/01/2017 — 08/01/2020.
  • Associate Editor, IISE Transactions (former IIE Transactions) on Design and Manufacturing, 02/01/2017 — 01/31/2020.
  • Guest Editor, IISE Transactions on Design and Manufacturing, Special issue on Additive Manufacturing, 03/2017 — 03/2018.
  • Member of Editorial Review Board, Journal of Quality Technology,  09/2016 –12/2018
  • Guest Editor, Journal of Quality Technology, Special Issue on Quality Engineering in Advanced Manufacturing, 2015-2016.
  • Associate Editor, IEEE Robotics and Automation Letters, 2015-12/2016.
  • Associate Editor, IEEE Transactions on Automation Science and Engineering, 01/2012-12/2016.
  • Member of scientific committee (Editorial Board) for the North American Manufacturing Research Institution (NAMRI) of SME, 2013-2015
  • Contributing Editor, InterNano (www.internano.org), online resource of the National Nanomanufacturing Network (NNN), 04/2012-04/2015.
  • Associate Editor(Quality, Micro and Nano Manufacturing Systems), SME Journal of Manufacturing Systems, 2008-2011.
  • Special Issue Editor, “Quality, Sensing and Prognostics Issues in Nanomanufacturing”, Special Issue of the IIE Transactions on Quality and Reliability Engineering/Manufacturing and Design.
  • Member of scientific committee (Editorial Board) for the North American Manufacturing Research Institution (NAMRI) of SME, 2009-2011
  • Member of IEEE CASE 2010 Program Committee for Track Automation in Meso, Micro and Nano-Scale.
  • Council member of QSR (Quality, Statistics, and Reliability) section at INFORMS, 2010-2012.
  • Associate Editor(Automation in Meso, Micro and Nano-Scale), 2009 IEEE Conference on Automation Science and Engineering (CASE 2009).
  • IISE Fellow, ASME Fellow, Senior member of IEEE, and member of INFORMS